ToF-SIMS
By :"J. C. Vickerman","David Briggs"
Published on 2013 by IM Publications
Category :"Mass spectrometry"
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Lenght : 732
Language : en
This Book was ranked 12 by Google Books for keyword surface detail
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